Field Directed Sputter Sharpening (FDSS) enables Tiptek to manufacture hard, conductive, and ultra-sharp probes. The probes are used for scanning probe microscopy, transfer of lamella formed by focused ion beams (FIB), and scanning electron microscope-based nanoprobes used in semiconductor failure analysis. The proprietary FDSS process developed by Tiptek co-founders sharpens the probe tip to atomic dimensions in a self-limiting fashion that does not require skilled operator intervention. The resulting probe tips give excellent high resolution over long periods of time, making them the standard for commercial and research customers.
TipTek at Research Park
- TipTek Featured in IntersectIllinois Article
- Tiptek Named 2022 SBIR/STTR Small Business of the Year by U.S. Department of Energy
Intern Awards